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Michelson Interferometer based on Model developed by Hilger & Watts London

Michelson Interferometer based on Model developed by Hilger & Watts London

Michelson Interferometer based on Model developed by Hilger & Watts London

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Model No: AGN-1812
It is a precision optical instrument designed for the study of interference phenomena, accurate determination of wavelengths, refractive indices, and other optical properties. The Hilger & Watts (London) model is divided into mechanical and optical parts, ensuring stability, accuracy, and ease of alignment during experiments.
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Technical Specifications

Mechanical Parts
  1. Bed – Optically ground, 250 mm in length, ensuring high stability and accurate placement of components.
  2. Lead Screw – Length 200 mm, pitch 1 mm, optically ground with matching nut for fine movement and measurement.
  3. Optical Mirror Mounts – Kinematic type, designed to hold mirrors securely with adjustment screws at the rear, enabling precise orthogonal alignment of mirrors.
Optical Parts
  1. Beam Splitter – Size 45 × 32 × 8 mm, optically worked glass plate, surface flatness λ/10, parallelism within 5 arc sec.
  2. Compensating Plate – Size 50 × 35 × 8 mm, made from the same glass as beam splitter to eliminate optical path differences.
  3. Mirrors – Two front surface mirrors, 25 mm in diameter, 10 mm thick, Al with SiO₂ protective coating, mounted in adjustable holders.
  4. Telescope – Supplied with a short focal length telescope for clear observation of interference fringes (light source not included).
Key Features
  • Classic Hilger & Watts design ensuring precision and durability.
  • High-quality optical glass with λ/10 surface accuracy.
  • Fine mechanical adjustments using optically ground lead screw and kinematic mirror mounts.
  • Front surface coated mirrors for maximum reflectivity and minimal distortion.
  • Accurate fringe visibility aided by compensating plate and beam splitter of identical material.
  • Least Count (L.C.) of instrument: 10⁻⁴ mm.
  • Suitable for experiments in wavelength measurement, refractive index studies, and interference pattern analysis.

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