Facebook-f Instagram Linkedin

Home >

Products >

Electronics Instruments >

Resistivity of Semiconductors By Four Probe Method

Resistivity of Semiconductors By Four Probe Method

Resistivity of Semiconductors By Four Probe Method

Categories: ,

Model No: AGN-EI-320
This apparatus is designed to measure the resistivity of semiconductor materials using the four-probe method and to determine the energy band gap by studying resistivity variations with temperature.
Enquire Now

Share

Technical Specifications

Related Products

DIGITAL MICROSCOPE

DIGITAL MICROSCOPE

Touch Screen Digital Moisture Balance

MOISTURE ANALYSER

CO2 INCUBATOR

CO2 INCUBATOR

Anaerobic Culture Jar

Anaerobic Culture Jar

Potometer Demonstration Apparatus

Microscope Slide

Microscope Slide

Send Enquiry